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| Photo : | Numéro de pièce du fabricant | Disponibilité en stock | Prix | Quantité | Fiche technique | Packaging | Series | ProductStatus | LogicType | SupplyVoltage | NumberofBits | OperatingTemperature | MountingType |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
SN74SSTEB32866ZWLRIC BUFF CONFIG REG 25BIT 96BGA Texas Instruments |
2,694 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Cut Tape (CT),Bulk | - | Active | Configurable Buffer with Address-Parity Test | 1.425V ~ 1.575V | 25 | -40°C ~ 85°C | Surface Mount |
|
SN74ABT8646DLRIC SCAN TEST DEVICE 28-SSOP Texas Instruments |
2,416 | - |
RFQ |
Fiche technique |
Tape & Reel (TR) | 74ABT | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
|
SN74LVTH182502APMIC SCAN-TEST-DEV/XCVR 64-LQFP Texas Instruments |
2,895 | - |
RFQ |
Fiche technique |
Bulk,Tray | 74LVTH | Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | 18 | -40°C ~ 85°C | Surface Mount |
|
|
SN74LVTH18502APMIC SCAN-TEST-DEV/XCVR 64-LQFP Texas Instruments |
2,394 | - |
RFQ |
Fiche technique |
Bulk,Tray | 74LVTH | Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | 18 | -40°C ~ 85°C | Surface Mount |
|
|
SN74LVTH18504APMIC SCAN-TEST-DEV/XCVR 64-LQFP Texas Instruments |
3,286 | - |
RFQ |
Fiche technique |
Bulk,Tray | 74LVTH | Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | 20 | -40°C ~ 85°C | Surface Mount |
|
SN74ABTE16245DLRIC 16BIT I-WS BUS TXRX 48-SSOP Texas Instruments |
3,249 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Bulk | 74ABTE | Active | Incident-Wave Switching Bus Transceivers | 4.5V ~ 5.5V | 16 | -40°C ~ 85°C | Surface Mount |
|
SN74LVT8996DWRIC 10-BIT SCAN PORT XCVR 24-SOIC Texas Instruments |
2,385 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Bulk | 74LVT | Active | Addressable Scan Ports | 2.7V ~ 3.6V | 10 | -40°C ~ 85°C | Surface Mount |
|
LM9779CCVS/NOPBIC DATA CONVERSION Texas Instruments |
3,881 | - |
RFQ |
Tray | * | Active | - | - | - | - | - | |
|
|
SN74SSQE32882ZCJRIC REG BUFF 28-56BIT 176BGA Texas Instruments |
3,203 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Cut Tape (CT) | - | Obsolete | 1:2 Registered Buffer with Parity | 1.425V ~ 1.575V | 28, 56 | 0°C ~ 85°C | Surface Mount |
|
|
SN74ABTE16246DLRIC 11-BIT I-WS BUS TXRX 48-SSOP Texas Instruments |
2,179 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Cut Tape (CT),Bulk | 74ABTE | Active | Incident-Wave Switching Bus Transceivers | 4.5V ~ 5.5V | 11 | -40°C ~ 85°C | Surface Mount |
|
|
SN74LVT8980ADWRIC TEST-BUS CONTROLLER 24-SOIC Texas Instruments |
3,738 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Bulk | 74LVT | Active | Embedded Test-Bus Controllers | 2.7V ~ 3.6V | 8 | -40°C ~ 85°C | Surface Mount |
|
|
SN74BCT8240ADWIC SCAN TEST DEVICE BUFF 24-SOIC Texas Instruments |
3,556 | - |
RFQ |
Fiche technique |
Bulk,Tube | 74BCT | Active | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount |
|
|
SN74BCT8373ADWIC SCAN TEST DEVICE LATCH 24SOIC Texas Instruments |
3,320 | - |
RFQ |
Fiche technique |
Bulk,Tube | 74BCT | Active | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount |
|
SN74ABT8646DWIC SCAN-TEST-DEV/XCVR 28-SOIC Texas Instruments |
3,929 | - |
RFQ |
Fiche technique |
Bulk,Tube | 74ABT | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
|
|
SN74BCT8245ADWIC SCAN TEST DEVICE TXRX 24-SOIC Texas Instruments |
3,686 | - |
RFQ |
Fiche technique |
Bulk,Tube | 74BCT | Active | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount |
|
|
SN74LVT8986PMIC LINK ADDRSS SCAN-PORT 64-LQFP Texas Instruments |
586 | - |
RFQ |
Fiche technique |
Bulk,Tray | 74LVT | Active | Linking Addressable Scan Ports | 2.7V ~ 3.6V | - | -40°C ~ 85°C | Surface Mount |
|
74SSTUB32868AZRHRIC REGSTR BUFFER 28-56BIT 176BGA Texas Instruments |
2,166 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Cut Tape (CT),Bulk | 74SSTUB | Active | 1:2 Configurable Registered Buffer with Parity | 1.7V ~ 1.9V | 28 | -40°C ~ 85°C | Surface Mount |
|
|
74SSTUB32868ZRHRIC CONFIG REG BUFF 28BIT 176-BGA Texas Instruments |
2,896 | - |
RFQ |
Fiche technique |
Tape & Reel (TR),Cut Tape (CT),Bulk | 74SSTUB | Active | 1:2 Configurable Registered Buffer with Parity | 1.7V ~ 1.9V | 28 | -40°C ~ 85°C | Surface Mount |
|
SN74ABT18640DLIC SCAN-TEST-DEV/TXRX 56-SSOP Texas Instruments |
3,983 | - |
RFQ |
Fiche technique |
Bulk,Tube | 74ABT | Active | Scan Test Device with Inverting Bus Transceivers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount |
|
|
SN74ABT8652DLIC SCAN-TEST-DEV/XCVR 28-SSOP Texas Instruments |
3,225 | - |
RFQ |
Fiche technique |
Bulk,Tube | 74ABT | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
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